Testing the robustness of two-boundary control policies in semiconductor manufacturing

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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Author(s)

  • Houmin Yan
  • Sheldon Lou
  • Suresh Sethi
  • Anne Gardel
  • Prabhat Deosthali

Detail(s)

Original languageEnglish
Pages (from-to)285-288
Journal / PublicationIEEE Transactions on Semiconductor Manufacturing
Volume9
Issue number2
Publication statusPublished - 1996
Externally publishedYes

Citation Format(s)

Testing the robustness of two-boundary control policies in semiconductor manufacturing. / Yan, Houmin; Lou, Sheldon; Sethi, Suresh; Gardel, Anne; Deosthali, Prabhat.

In: IEEE Transactions on Semiconductor Manufacturing, Vol. 9, No. 2, 1996, p. 285-288.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review