Testing the robustness of two-boundary control policies in semiconductor manufacturing

Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

Overview

25 Scopus Citations

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Author(s)

Houmin Yan
Sheldon Lou
Suresh Sethi
Anne Gardel
Prabhat Deosthali

Detail(s)

Original language	English
Pages (from-to)	285-288
Journal / Publication	IEEE Transactions on Semiconductor Manufacturing
Volume	9
Issue number	2
Publication status	Published - 1996
Externally published	Yes

Link(s)

DOI	DOI https://doi.org/10.1109/66.492825 Final Published version
	Check@CityULib
Link to Scopus	https://www.scopus.com/record/display.uri?eid=2-s2.0-0030150598&origin=recordpage
Permanent Link	https://scholars.cityu.edu.hk/en/publications/publication(1e64f162-74c9-474c-8dda-3f5ddc983b75).html

Citation Format(s)

[ RIS ] [ BibTeX ]

Testing the robustness of two-boundary control policies in semiconductor manufacturing. / Yan, Houmin; Lou, Sheldon; Sethi, Suresh et al.
In: IEEE Transactions on Semiconductor Manufacturing, Vol. 9, No. 2, 1996, p. 285-288.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

Yan, H, Lou, S, Sethi, S, Gardel, A & Deosthali, P 1996, 'Testing the robustness of two-boundary control policies in semiconductor manufacturing', IEEE Transactions on Semiconductor Manufacturing, vol. 9, no. 2, pp. 285-288. https://doi.org/10.1109/66.492825

Yan, H., Lou, S., Sethi, S., Gardel, A., & Deosthali, P. (1996). Testing the robustness of two-boundary control policies in semiconductor manufacturing. IEEE Transactions on Semiconductor Manufacturing, 9(2), 285-288. https://doi.org/10.1109/66.492825

Yan H, Lou S, Sethi S, Gardel A, Deosthali P. Testing the robustness of two-boundary control policies in semiconductor manufacturing. IEEE Transactions on Semiconductor Manufacturing. 1996;9(2):285-288. doi: 10.1109/66.492825

Yan, Houmin ; Lou, Sheldon ; Sethi, Suresh et al. / Testing the robustness of two-boundary control policies in semiconductor manufacturing. In: IEEE Transactions on Semiconductor Manufacturing. 1996 ; Vol. 9, No. 2. pp. 285-288.