Testing the robustness of two-boundary control policies in semiconductor manufacturing

Houmin Yan; Sheldon Lou; Suresh Sethi; Anne Gardel; Prabhat Deosthali

doi:10.1109/66.492825

Testing the robustness of two-boundary control policies in semiconductor manufacturing

Houmin Yan
, Sheldon Lou
, Suresh Sethi
, Anne Gardel
, Prabhat Deosthali

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

Original language	English
Pages (from-to)	285-288
Journal	IEEE Transactions on Semiconductor Manufacturing
Volume	9
Issue number	2
DOIs	https://doi.org/10.1109/66.492825
Publication status	Published - 1996
Externally published	Yes

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@article{1e64f16274c9474c8dda3f5ddc983b75,

title = "Testing the robustness of two-boundary control policies in semiconductor manufacturing",

author = "Houmin Yan and Sheldon Lou and Suresh Sethi and Anne Gardel and Prabhat Deosthali",

year = "1996",

doi = "10.1109/66.492825",

language = "English",

volume = "9",

pages = "285--288",

journal = "IEEE Transactions on Semiconductor Manufacturing",

issn = "0894-6507",

publisher = "IEEE",

number = "2",

}

TY - JOUR

T1 - Testing the robustness of two-boundary control policies in semiconductor manufacturing

AU - Yan, Houmin

AU - Lou, Sheldon

AU - Sethi, Suresh

AU - Gardel, Anne

AU - Deosthali, Prabhat

PY - 1996

Y1 - 1996

UR - https://www.scopus.com/pages/publications/0030150598

UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-0030150598&origin=recordpage

U2 - 10.1109/66.492825

DO - 10.1109/66.492825

M3 - RGC 21 - Publication in refereed journal

SN - 0894-6507

VL - 9

SP - 285

EP - 288

JO - IEEE Transactions on Semiconductor Manufacturing

JF - IEEE Transactions on Semiconductor Manufacturing

IS - 2

ER -

Testing the robustness of two-boundary control policies in semiconductor manufacturing

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