TY - JOUR
T1 - Tensile behavior of amorphous/nanocrystalline ZrCu/Cu multilayered films with graded interfaces
AU - Pei, H.J.
AU - Kuan, S.Y.
AU - Liu, M.C.
AU - Huang, J.C.
PY - 2012/12
Y1 - 2012/12
N2 - The microstructure and tensile response of amorphous ZrCu and nanocrystalline Cu multilayered thin films, with sharp or graded interfaces, are examined and analyzed. The extracted tensile properties of the multilayered films can be compared with the predicted values based on the iso-strain Rule of Mixture model. The multilayered films with graded interfaces, each about 50 nm thick, consistently exhibit higher tensile strength and elongation. This can be rationalized by the reduced stress and strain incompatibility along the interfaces.
AB - The microstructure and tensile response of amorphous ZrCu and nanocrystalline Cu multilayered thin films, with sharp or graded interfaces, are examined and analyzed. The extracted tensile properties of the multilayered films can be compared with the predicted values based on the iso-strain Rule of Mixture model. The multilayered films with graded interfaces, each about 50 nm thick, consistently exhibit higher tensile strength and elongation. This can be rationalized by the reduced stress and strain incompatibility along the interfaces.
KW - A. Nanostructured intermetallics
KW - B. Glasses, metallic
KW - B. Mechanical properties at ambient temperature
KW - C. Thin films
KW - F. Mechanical testing
UR - http://www.scopus.com/inward/record.url?scp=84867016930&partnerID=8YFLogxK
UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-84867016930&origin=recordpage
U2 - 10.1016/j.intermet.2012.07.002
DO - 10.1016/j.intermet.2012.07.002
M3 - RGC 21 - Publication in refereed journal
SN - 0966-9795
VL - 31
SP - 191
EP - 195
JO - Intermetallics
JF - Intermetallics
ER -