Temperature evolution of carrier dynamics in GaN_xP_yAs_1-y-xalloys

The temperature dependence of carrier dynamics in GaN_xAs_1-yP_y alloys has been investigated by time resolved photoluminescence. This investigation has shown that the decay time constant does not change significantly up to 100 K, and then starts to decrease rapidly above this temperature. Additionally, the decay times at the high-energy side of the spectrum decrease faster than those at the low-energy side. The effects have been explained by the interplay between carrier capture by radiative and nonradiative recombination centers. Detailed simulations show that the effect of carrier localization in the investigated materials is better described by double-scale potential fluctuations that are related to (i) distribution of localized states energy and (ii) bandgap fluctuations. In addition, it was observed that the increase in nitrogen concentration leads to a shorter decay time at room temperature, which is attributed to a larger concentration of non-radiative recombination centers. Furthermore, a post-growth annealing step leads to a longer decay time at room temperature, which is attributed to a reduction in non-radiative recombination centers. At low temperatures, the role of non-radiative centers is suppressed, and therefore the decay time does not differ significantly for samples with either different nitrogen concentrations or in both the as-grown and annealed samples.