TEM and EDS investigation of heterogeneous interfaces in cofired multilayer ceramic capacitors

Ruzhong Zuo; Longtu Li; Zhilun Gui; Takfu Hung; Zhengkui Xu

doi:10.1016/S0921-5107(02)00094-6

TEM and EDS investigation of heterogeneous interfaces in cofired multilayer ceramic capacitors

Ruzhong Zuo, Longtu Li, Zhilun Gui, Takfu Hung, Zhengkui Xu

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

14 Citations (Scopus)

Abstract

The interfacial microstructure and cofiring migration between Ag-Pd electrode and Pb-based relaxor ferroelectric ceramics were directly investigated via transmission electron microscope and energy dispersive X-ray spectroscopy (EDS). Different silver migration abilities of 70Ag-30Pd and 90Ag-10Pd electrodes were confirmed by EDS microanalysis. This difference is generally considered to be responsible for different effects of inside electrode on the reliability of multilayer cofired devices. Further, Pb diffusion and new phase formation near the interface were detected, incorporating interfacial microstructural observation. A good consistency of direct experimental evidence to the following theoretic analyses was well combined in this paper. © 2002 Elsevier Science B.V. All rights reserved.

Original language	English
Pages (from-to)	1-5
Journal	Materials Science and Engineering B: Solid-State Materials for Advanced Technology
Volume	95
Issue number	1
DOIs	https://doi.org/10.1016/S0921-5107(02)00094-6
Publication status	Published - 1 Jul 2002

Research Keywords

Cofiring
EDS
Interdiffusion
Interface
TEM

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title = "TEM and EDS investigation of heterogeneous interfaces in cofired multilayer ceramic capacitors",

abstract = "The interfacial microstructure and cofiring migration between Ag-Pd electrode and Pb-based relaxor ferroelectric ceramics were directly investigated via transmission electron microscope and energy dispersive X-ray spectroscopy (EDS). Different silver migration abilities of 70Ag-30Pd and 90Ag-10Pd electrodes were confirmed by EDS microanalysis. This difference is generally considered to be responsible for different effects of inside electrode on the reliability of multilayer cofired devices. Further, Pb diffusion and new phase formation near the interface were detected, incorporating interfacial microstructural observation. A good consistency of direct experimental evidence to the following theoretic analyses was well combined in this paper. {\textcopyright} 2002 Elsevier Science B.V. All rights reserved.",

keywords = "Cofiring, EDS, Interdiffusion, Interface, TEM",

author = "Ruzhong Zuo and Longtu Li and Zhilun Gui and Takfu Hung and Zhengkui Xu",

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TEM and EDS investigation of heterogeneous interfaces in cofired multilayer ceramic capacitors. / Zuo, Ruzhong; Li, Longtu; Gui, Zhilun et al.
In: Materials Science and Engineering B: Solid-State Materials for Advanced Technology, Vol. 95, No. 1, 01.07.2002, p. 1-5.

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

TY - JOUR

T1 - TEM and EDS investigation of heterogeneous interfaces in cofired multilayer ceramic capacitors

AU - Zuo, Ruzhong

AU - Li, Longtu

AU - Gui, Zhilun

AU - Hung, Takfu

AU - Xu, Zhengkui

PY - 2002/7/1

Y1 - 2002/7/1

N2 - The interfacial microstructure and cofiring migration between Ag-Pd electrode and Pb-based relaxor ferroelectric ceramics were directly investigated via transmission electron microscope and energy dispersive X-ray spectroscopy (EDS). Different silver migration abilities of 70Ag-30Pd and 90Ag-10Pd electrodes were confirmed by EDS microanalysis. This difference is generally considered to be responsible for different effects of inside electrode on the reliability of multilayer cofired devices. Further, Pb diffusion and new phase formation near the interface were detected, incorporating interfacial microstructural observation. A good consistency of direct experimental evidence to the following theoretic analyses was well combined in this paper. © 2002 Elsevier Science B.V. All rights reserved.

AB - The interfacial microstructure and cofiring migration between Ag-Pd electrode and Pb-based relaxor ferroelectric ceramics were directly investigated via transmission electron microscope and energy dispersive X-ray spectroscopy (EDS). Different silver migration abilities of 70Ag-30Pd and 90Ag-10Pd electrodes were confirmed by EDS microanalysis. This difference is generally considered to be responsible for different effects of inside electrode on the reliability of multilayer cofired devices. Further, Pb diffusion and new phase formation near the interface were detected, incorporating interfacial microstructural observation. A good consistency of direct experimental evidence to the following theoretic analyses was well combined in this paper. © 2002 Elsevier Science B.V. All rights reserved.

KW - Cofiring

KW - EDS

KW - Interdiffusion

KW - Interface

KW - TEM

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UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-0036641475&origin=recordpage

U2 - 10.1016/S0921-5107(02)00094-6

DO - 10.1016/S0921-5107(02)00094-6

M3 - RGC 21 - Publication in refereed journal

SN - 0921-5107

VL - 95

SP - 1

EP - 5

JO - Materials Science and Engineering B: Solid-State Materials for Advanced Technology

JF - Materials Science and Engineering B: Solid-State Materials for Advanced Technology

IS - 1

ER -

TEM and EDS investigation of heterogeneous interfaces in cofired multilayer ceramic capacitors

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