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Task-Adaptive Negative Envision for Few-Shot Open-Set Recognition

  • Shiyuan Huang*
  • , Jiawei Ma*
  • , Guangxing Han
  • , Shih-Fu Chang
  • *Corresponding author for this work

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

Abstract

We study the problem of few-shot open-set recognition (FSOR), which learns a recognition system capable of both fast adaptation to new classes with limited labeled examples and rejection of unknown negative samples. Traditional large-scale open-set methods have been shown in-effective for FSOR problem due to data limitation. Current FSOR methods typically calibrate few-shot closed-set classifiers to be sensitive to negative samples so that they can be rejected via thresholding. However, threshold tuning is a challenging process as different FSOR tasks may require different rejection powers. In this paper, we instead propose task-adaptive negative class envision for FSOR to integrate threshold tuning into the learning process. Specifically, we augment the few-shot closed-set classifier with additional negative prototypes generated from few-shot examples. By incorporating few-shot class correlations in the negative generation process, we are able to learn dynamic rejection boundaries for FSOR tasks. Besides, we extend our method to generalized few-shot open-set recognition (GF-SOR), which requires classification on both many-shot and few-shot classes as well as rejection of negative samples. Extensive experiments on public benchmarks validate our methods on both problems. Code available at https://github.com/shiyuanh/TANE © 2022 IEEE.
Original languageEnglish
Title of host publicationProceedings - 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022
Place of PublicationLos Alamitos, Calif.
PublisherIEEE
Pages7161-7170
ISBN (Electronic)9781665469463
ISBN (Print)9781665469470
DOIs
Publication statusPublished - 2022
Externally publishedYes
Event2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR 2022) - Hybrid, New Orleans, United States
Duration: 19 Jun 202224 Jun 2022
https://cvpr2022.thecvf.com/

Publication series

NameProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
Volume2022-June
ISSN (Print)1063-6919
ISSN (Electronic)2575-7075

Conference

Conference2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR 2022)
PlaceUnited States
CityNew Orleans
Period19/06/2224/06/22
Internet address

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