Tapping-mode tuning-fork near-field scanning optical microscopy of low power semiconductor lasers

N. H. Lu; W. C. Lin; D. P. Tsai

doi:10.1046/j.1365-2818.2001.00801.x

Tapping-mode tuning-fork near-field scanning optical microscopy of low power semiconductor lasers

N. H. Lu, W. C. Lin, D. P. Tsai

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

5 Citations (Scopus)

Abstract

The newly developed inverted tapping-mode tuning-fork near-field scanning optical microscopy (TMTF-NSOM) is used to study the local near-field optical properties of strained AlGaInP/Ga_0.4In_0.6P low power visible multiquantum-well laser diodes. In contrast to shear-force mode NSOM, TMTF-NSOM provides the function to acquire the evanescent wave intensity ratio |I(2ω)|/|I(ω)| image, from which the evanescent wave decay coefficient q can be evaluated for a known tapping amplitude. Moreover, we probe the near-field stimulated emission spectrum, which gives the free-space laser light wavelength λ_O and the index of refraction n_r of the laser diode resonant cavity. Once q, λ_O, and n_r are all measured, we can determine the angle of incidence θ_O of the dominant totally internally reflected waves incident on the front mirror facet of the resonator. Determination of such an angle is very important in modelling the stability of the laser diode resonator.

Original language	English
Pages (from-to)	172-175
Journal	Journal of Microscopy
Volume	202
Issue number	1
DOIs	https://doi.org/10.1046/j.1365-2818.2001.00801.x
Publication status	Published - 2001
Externally published	Yes

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Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

Research Keywords

Evanescent waves
Near-field scanning optical microscopy
Semiconductor laser
Tapping-mode

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@article{efa021192ccd4d18b986bb22ce9b170e,

title = "Tapping-mode tuning-fork near-field scanning optical microscopy of low power semiconductor lasers",

abstract = "The newly developed inverted tapping-mode tuning-fork near-field scanning optical microscopy (TMTF-NSOM) is used to study the local near-field optical properties of strained AlGaInP/Ga0.4In0.6P low power visible multiquantum-well laser diodes. In contrast to shear-force mode NSOM, TMTF-NSOM provides the function to acquire the evanescent wave intensity ratio |I(2ω)|/|I(ω)| image, from which the evanescent wave decay coefficient q can be evaluated for a known tapping amplitude. Moreover, we probe the near-field stimulated emission spectrum, which gives the free-space laser light wavelength λO and the index of refraction nr of the laser diode resonant cavity. Once q, λO, and nr are all measured, we can determine the angle of incidence θO of the dominant totally internally reflected waves incident on the front mirror facet of the resonator. Determination of such an angle is very important in modelling the stability of the laser diode resonator.",

keywords = "Evanescent waves, Near-field scanning optical microscopy, Semiconductor laser, Tapping-mode",

author = "Lu, {N. H.} and Lin, {W. C.} and Tsai, {D. P.}",

note = "Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected]. ",

year = "2001",

doi = "10.1046/j.1365-2818.2001.00801.x",

language = "English",

volume = "202",

pages = "172--175",

journal = "Journal of Microscopy",

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TY - JOUR

T1 - Tapping-mode tuning-fork near-field scanning optical microscopy of low power semiconductor lasers

AU - Lu, N. H.

AU - Lin, W. C.

AU - Tsai, D. P.

N1 - Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

PY - 2001

Y1 - 2001

N2 - The newly developed inverted tapping-mode tuning-fork near-field scanning optical microscopy (TMTF-NSOM) is used to study the local near-field optical properties of strained AlGaInP/Ga0.4In0.6P low power visible multiquantum-well laser diodes. In contrast to shear-force mode NSOM, TMTF-NSOM provides the function to acquire the evanescent wave intensity ratio |I(2ω)|/|I(ω)| image, from which the evanescent wave decay coefficient q can be evaluated for a known tapping amplitude. Moreover, we probe the near-field stimulated emission spectrum, which gives the free-space laser light wavelength λO and the index of refraction nr of the laser diode resonant cavity. Once q, λO, and nr are all measured, we can determine the angle of incidence θO of the dominant totally internally reflected waves incident on the front mirror facet of the resonator. Determination of such an angle is very important in modelling the stability of the laser diode resonator.

AB - The newly developed inverted tapping-mode tuning-fork near-field scanning optical microscopy (TMTF-NSOM) is used to study the local near-field optical properties of strained AlGaInP/Ga0.4In0.6P low power visible multiquantum-well laser diodes. In contrast to shear-force mode NSOM, TMTF-NSOM provides the function to acquire the evanescent wave intensity ratio |I(2ω)|/|I(ω)| image, from which the evanescent wave decay coefficient q can be evaluated for a known tapping amplitude. Moreover, we probe the near-field stimulated emission spectrum, which gives the free-space laser light wavelength λO and the index of refraction nr of the laser diode resonant cavity. Once q, λO, and nr are all measured, we can determine the angle of incidence θO of the dominant totally internally reflected waves incident on the front mirror facet of the resonator. Determination of such an angle is very important in modelling the stability of the laser diode resonator.

KW - Evanescent waves

KW - Near-field scanning optical microscopy

KW - Semiconductor laser

KW - Tapping-mode

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DO - 10.1046/j.1365-2818.2001.00801.x

M3 - RGC 21 - Publication in refereed journal

C2 - 11298888

SN - 0022-2720

VL - 202

SP - 172

EP - 175

JO - Journal of Microscopy

JF - Journal of Microscopy

IS - 1

ER -

Tapping-mode tuning-fork near-field scanning optical microscopy of low power semiconductor lasers

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