System and Method for Detecting a Defect in a Structure Member

Research output: Patents, Agreements and Assignments (RGC: 51, 52, 53)51_Patents granted (CityU only, data source from KTO)

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Author(s)

Detail(s)

Original languageEnglish
Patent numberUS9,709,437
Filing number14/624,728
Publication status
  • Accepted/In press/Filed - 18 Feb 2015
  • Published - 18 Jul 2017

Citation Format(s)

System and Method for Detecting a Defect in a Structure Member. / CHENG, Tin Kei (Inventor); LAU, Denvid (Inventor).

Patent No.: US9,709,437. Jul 18, 2017.

Research output: Patents, Agreements and Assignments (RGC: 51, 52, 53)51_Patents granted (CityU only, data source from KTO)