Synthesis of taperlike Si nanowires with strong field emission

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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Author(s)

  • Y. L. Chueh
  • L. J. Chou
  • S. L. Cheng
  • W. W. Wu
  • L. J. Chen

Detail(s)

Original languageEnglish
Article number133112
Pages (from-to)1-3
Journal / PublicationApplied Physics Letters
Volume86
Issue number13
Online published24 Mar 2005
Publication statusPublished - 28 Mar 2005
Externally publishedYes

Abstract

Taperlike Si nanowires (SiNWs) have been synthesized by annealing of high-density FeSi2 nanodots on (001)Si at 1200 °C in a N2 ambient. The tip regions of SiNWs are about 5-10 nm in diameter. The average length of the SiNWs is about 6 μm with aspect ratios as high as 150-170. A growth model based on oxide-assisted growth is proposed. The taperlike morphology may be caused by the passivation of the SiO2 coating layer, which results in the different levels of absorption of SiO along the length of the nanowires. The SiNWs exhibit a turn-on field of 6.3-7.3 V/μm and a threshold field of 9-10 V/μm. The excellent field emission characteristics are attributed to the taperlike geometry of the crystalline Si nanowires. © 2005 American Institute of Physics.

Citation Format(s)

Synthesis of taperlike Si nanowires with strong field emission. / Chueh, Y. L.; Chou, L. J.; Cheng, S. L. et al.

In: Applied Physics Letters, Vol. 86, No. 13, 133112, 28.03.2005, p. 1-3.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review