Synthesis of Silicon-on-Insulator (SOI) Materials by Plasma Immersion Ion Implantation

    Research output: Conference PapersRGC 31A - Invited conference paper (refereed items)Yespeer-review

    Abstract

    Plasma immersion ion implantation (PIII) is a burgeoning technique in semiconductor processing. In addition to the conventional applications on the formation of shallow junctions and conformal doping, PIII excels in the production of silicon-on-insulator (SOI) materials. SOI offers many unique advantages over silicon substrates for deep submicrometer integrated circuits (IC) and is the preferred materials to fabricate low power, high speed, submicrometer devices. However, SOI is not commonly used commercially due to its high cost. In this paper, we will discuss the driving force behind SOI, current production issues, as well as our latest work of SOI synthesis by PIII using oxygen ion implantation and wafer bonding / ion cutting.
    Original languageEnglish
    Pages291-296
    Publication statusPublished - Nov 1997
    EventInternational Conference on Surface Engineering Shanghai '97: Surface Engineering towards the 21st Century - Shanghai, China
    Duration: 18 Nov 199721 Nov 1997

    Conference

    ConferenceInternational Conference on Surface Engineering Shanghai '97
    Abbreviated titleICSE Shanghai '97
    Country/TerritoryChina
    CityShanghai
    Period18/11/9721/11/97

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