Abstract
Ge 1-xSn x thin films are interesting for all-group-IV optoelectronics because of a crossover to a direct bandgap with dilute Sn alloying. However, Sn has vanishing room-temperature equilibrium solubility in Ge, making their synthesis very challenging. Herein, we report on our attempts to synthesize Ge 1-xSn x films on Ge (001) using ion implantation and pulsed laser melting (II-PLM). A maximum of 2 at.% Sn was incorporated with our experimental conditions in the samples as determined by Rutherford back scattering spectroscopy. A red-shift in the Ge optical phonon branch and increased absorption below the Ge bandgap with increasing Sn concentration indicate Sn-induced lattice- and band-structure changes after II-PLM. However, ion-channeling and electron microscopy show that the films are not of sufficient epitaxial quality for use in devices. © 2011 TMS.
| Original language | English |
|---|---|
| Pages (from-to) | 837-844 |
| Journal | Journal of Electronic Materials |
| Volume | 41 |
| Issue number | 5 |
| DOIs | |
| Publication status | Published - May 2012 |
| Externally published | Yes |
Research Keywords
- Ge 1-xSn x alloy
- Ion implantation
- Pulsed laser melting (PLM)
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