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Synthesis of Ge 1-xSn x alloy thin films using ion implantation and pulsed laser melting (II-PLM)

A. Bhatia, W. M. Hlaing Oo, G. Siegel, P. R. Stone, K. M. Yu, M. A. Scarpulla

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

Abstract

Ge 1-xSn x thin films are interesting for all-group-IV optoelectronics because of a crossover to a direct bandgap with dilute Sn alloying. However, Sn has vanishing room-temperature equilibrium solubility in Ge, making their synthesis very challenging. Herein, we report on our attempts to synthesize Ge 1-xSn x films on Ge (001) using ion implantation and pulsed laser melting (II-PLM). A maximum of 2 at.% Sn was incorporated with our experimental conditions in the samples as determined by Rutherford back scattering spectroscopy. A red-shift in the Ge optical phonon branch and increased absorption below the Ge bandgap with increasing Sn concentration indicate Sn-induced lattice- and band-structure changes after II-PLM. However, ion-channeling and electron microscopy show that the films are not of sufficient epitaxial quality for use in devices. © 2011 TMS.
Original languageEnglish
Pages (from-to)837-844
JournalJournal of Electronic Materials
Volume41
Issue number5
DOIs
Publication statusPublished - May 2012
Externally publishedYes

Research Keywords

  • Ge 1-xSn x alloy
  • Ion implantation
  • Pulsed laser melting (PLM)

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