Abstract
The oxide-assisted method via the laser ablation of a powder mixture of GaP and Ga2O3 was used to synthesize GaP nanowires about 22 nm in diameter and hundreds of micrometers in length. The growth of GaP nanowires was interpreted using the oxide-assisted mechanism involving several oxidation-reduction reactions. Two typical planar defects, stacking faults and twins, were observed in the GaP nanowires with some special morphologies. The formation of both kinds of planar defects was closely related to the variation of the morphologies of the nanowires from a straight and homogeneous one.
| Original language | English |
|---|---|
| Pages (from-to) | 1115-1118 |
| Journal | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures |
| Volume | 19 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - Jul 2001 |
| Event | 19th North American Conference on Molecular Beam Epitaxy (NAMBE-19) - Tempe, AZ, United States Duration: 15 Oct 2000 → 18 Oct 2000 |