Synchrotron X-ray micro-tomography at the Advanced Light Source : Developments in high-temperature in-situ mechanical testing

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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Author(s)

  • Harold S. Barnard
  • A.A. MacDowell
  • D.Y. Parkinson
  • P. Mandal
  • M. Czabaj
  • Y. Gao
  • E. Maillet
  • B. Blank
  • N.M. Larson
  • B. Gludovatz
  • C. Acevedo
  • D. Liu

Detail(s)

Original languageEnglish
Article number012043
Journal / PublicationJournal of Physics: Conference Series
Volume849
Online published14 Jun 2017
Publication statusPublished - 2017
Externally publishedYes

Conference

Title13th International X-ray Microscopy Conference (XRM 2016)
LocationOxford University
PlaceUnited Kingdom
CityOxford
Period15 - 19 August 2016

Abstract

At the Advanced Light Source (ALS), Beamline 8.3.2 performs hard X-ray micro-tomography under conditions of high temperature, pressure, mechanical loading, and other realistic conditions using environmental test cells. With scan times of 10s-100s of seconds, the microstructural evolution of materials can be directly observed over multiple time steps spanning prescribed changes in the sample environment. This capability enables in-situ quasi-static mechanical testing of materials. We present an overview of our in-situ mechanical testing capabilities and recent hardware developments that enable flexural testing at high temperature and in combination with acoustic emission analysis.

Citation Format(s)

Synchrotron X-ray micro-tomography at the Advanced Light Source : Developments in high-temperature in-situ mechanical testing. / Barnard, Harold S.; MacDowell, A.A.; Parkinson, D.Y.; Mandal, P.; Czabaj, M.; Gao, Y.; Maillet, E.; Blank, B.; Larson, N.M.; Ritchie, R.O.; Gludovatz, B.; Acevedo, C.; Liu, D.

In: Journal of Physics: Conference Series, Vol. 849, 012043, 2017.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review