Synchrotron X-ray micro-tomography at the Advanced Light Source : Developments in high-temperature in-situ mechanical testing
Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Article number | 012043 |
Journal / Publication | Journal of Physics: Conference Series |
Volume | 849 |
Online published | 14 Jun 2017 |
Publication status | Published - 2017 |
Externally published | Yes |
Conference
Title | 13th International X-ray Microscopy Conference (XRM 2016) |
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Location | Oxford University |
Place | United Kingdom |
City | Oxford |
Period | 15 - 19 August 2016 |
Link(s)
DOI | DOI |
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Attachment(s) | Documents
Publisher's Copyright Statement
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Link to Scopus | https://www.scopus.com/record/display.uri?eid=2-s2.0-85022064121&origin=recordpage |
Permanent Link | https://scholars.cityu.edu.hk/en/publications/publication(66ff5a75-c63a-49a3-9a3f-339af5630693).html |
Abstract
At the Advanced Light Source (ALS), Beamline 8.3.2 performs hard X-ray micro-tomography under conditions of high temperature, pressure, mechanical loading, and other realistic conditions using environmental test cells. With scan times of 10s-100s of seconds, the microstructural evolution of materials can be directly observed over multiple time steps spanning prescribed changes in the sample environment. This capability enables in-situ quasi-static mechanical testing of materials. We present an overview of our in-situ mechanical testing capabilities and recent hardware developments that enable flexural testing at high temperature and in combination with acoustic emission analysis.
Research Area(s)
Citation Format(s)
Synchrotron X-ray micro-tomography at the Advanced Light Source : Developments in high-temperature in-situ mechanical testing. / Barnard, Harold S.; MacDowell, A.A.; Parkinson, D.Y. et al.
In: Journal of Physics: Conference Series, Vol. 849, 012043, 2017.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
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