Abstract
Surface photovoltage (SPV) spectra were measured for GaN 0.014As0.986 layers at room temperature and compared with room temperature photoreflectance (PR) and contactless electroreflectance (CER) measurements. Spectral features related to E- and E+ transitions were clearly observed in SPV spectra at energies corresponding to PR and CER resonances. In this way it has been shown that SPV spectroscopy is an alternative absorption-like technique to study both the E- and E + transitions in dilute nitrides. The observation of E+ transition in SPV spectra means that it is a direct optical transition at the Γ point of GaNAs band structure which can be explained by the band anticrossing interaction between the localized states of N and the extended conduction band states of the GaAs host. © 2014 Elsevier B.V.
| Original language | English |
|---|---|
| Pages (from-to) | 101-104 |
| Journal | Thin Solid Films |
| Volume | 567 |
| DOIs | |
| Publication status | Published - 30 Sept 2014 |
| Externally published | Yes |
Research Keywords
- Contactless electroreflectance
- Dilute nitrides
- Photoreflectance
- Surface photovoltage
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