TY - JOUR
T1 - Surface etching of MgO
T2 - LiNbO3 crystal by ti metal for integrated optics
AU - Zhang, De-Long
AU - Zhang, Pei
AU - Zhou, Hao-Jiang
AU - Cui, Yu-Ming
AU - Pun, Edwin Yue-Bun
PY - 2010
Y1 - 2010
N2 - Surface etching of a MgO-doped LiNbO3 crystal is demonstrated by annealing a sandwich structure formed by Mg: LiNbO3/Ti film/Mg: LiNbO3 at 1050-1100°C in a wet O2 atmosphere. The etching depth, raised Ti layer height and surface roughness were studied as a function of initial Ti film thickness, annealing temperature, and duration. The results show that the maximum etching depth can reach 260 nm while the surface roughness is 3 crystalline phase and the original crystal composition but is also Ti-free. An etching mechanism based upon an electrochemical reaction process is proposed. The MgO doping effect on the etching rate and surface roughness is discussed and explained in terms of the MgO doping effect on Ti solubility. A comparison of the +Z and -Z surface etching is made. Finally, the present method is compared with other etching techniques and its possible application is suggested. © 2010 The Electrochemical Society.
AB - Surface etching of a MgO-doped LiNbO3 crystal is demonstrated by annealing a sandwich structure formed by Mg: LiNbO3/Ti film/Mg: LiNbO3 at 1050-1100°C in a wet O2 atmosphere. The etching depth, raised Ti layer height and surface roughness were studied as a function of initial Ti film thickness, annealing temperature, and duration. The results show that the maximum etching depth can reach 260 nm while the surface roughness is 3 crystalline phase and the original crystal composition but is also Ti-free. An etching mechanism based upon an electrochemical reaction process is proposed. The MgO doping effect on the etching rate and surface roughness is discussed and explained in terms of the MgO doping effect on Ti solubility. A comparison of the +Z and -Z surface etching is made. Finally, the present method is compared with other etching techniques and its possible application is suggested. © 2010 The Electrochemical Society.
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U2 - 10.1149/1.3458861
DO - 10.1149/1.3458861
M3 - RGC 21 - Publication in refereed journal
SN - 0013-4651
VL - 157
JO - Journal of the Electrochemical Society
JF - Journal of the Electrochemical Society
IS - 9
ER -