Skip to main navigation Skip to search Skip to main content

Supervised Masked Knowledge Distillation for Few-Shot Transformers

  • Han Lin
  • , Guangxing Han*
  • , Jiawei Ma
  • , Shiyuan Huang
  • , Xudong Lin
  • , Shih-Fu Chang
  • *Corresponding author for this work

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

Abstract

Vision Transformers (ViTs) emerge to achieve impressive performance on many data-abundant computer vision tasks by capturing long-range dependencies among local features. However, under few-shot learning (FSL) settings on small datasets with only a few labeled data, ViT tends to overfit and suffers from severe performance degradation due to its absence of CNN-alike inductive bias. Previous works in FSL avoid such problem either through the help of self-supervised auxiliary losses, or through the dextile uses of label information under supervised settings. But the gap between self-supervised and supervised few-shot Transformers is still unfilled. Inspired by recent advances in self-supervised knowledge distillation and masked image modeling (MIM), we propose a novel Supervised Masked Knowledge Distillation model (SMKD) for few-shot Transformers which incorporates label information into self-distillation frameworks. Compared with previous self-supervised methods, we allow intra-class knowledge distillation on both class and patch tokens, and introduce the challenging task of masked patch tokens reconstruction across intra-class images. Experimental results on four few-shot classification benchmark datasets show that our method with simple design outperforms previous methods by a large margin and achieves a new start-of-the-art. Detailed ablation studies confirm the effectiveness of each component of our model. Code for this paper is available here: https://github.com/HL-hanlin/SMKD. © 2023 IEEE.
Original languageEnglish
Title of host publicationProceedings - 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023
PublisherIEEE
Pages19649-19659
ISBN (Electronic)979-8-3503-0129-8
ISBN (Print)979-8-3503-0130-4
DOIs
Publication statusPublished - 2023
Externally publishedYes
Event2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR 2023) - Vancouver Convention Center, Vancouver, Canada
Duration: 18 Jun 202322 Jun 2023
https://cvpr2023.thecvf.com/Conferences/2023
https://openaccess.thecvf.com/menu
https://ieeexplore.ieee.org/xpl/conhome/1000147/all-proceedings

Publication series

NameProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
ISSN (Print)1063-6919
ISSN (Electronic)2575-7075

Conference

Conference2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR 2023)
Abbreviated titleCVPR2023
PlaceCanada
CityVancouver
Period18/06/2322/06/23
Internet address

Research Keywords

  • continual
  • low-shot
  • meta
  • or long-tail learning
  • Transfer

Fingerprint

Dive into the research topics of 'Supervised Masked Knowledge Distillation for Few-Shot Transformers'. Together they form a unique fingerprint.

Cite this