TY - GEN
T1 - Subjective image quality assessment at the threshold level
AU - White, C.
AU - Martin, R.
AU - Wu, D.
AU - Tan, C. S.
AU - Tan, D. M.
AU - Wu, H. R.
AU - Cai, J.
N1 - Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].
PY - 2005
Y1 - 2005
N2 - A subjective method for assessing image quality at the threshold level is presented. The assessment methodology has a trichotomous (3-way) structure. It looks at some problems associated with subjective assessments, particularly fatigue and scanning effects. In addition, it addresses the elusive issue of the minimum sample size necessary to achieve statistical relevance in subjective tests. This leads to the question of the reliability of subjects, a problem which may be resolved with a robust assessment method.
AB - A subjective method for assessing image quality at the threshold level is presented. The assessment methodology has a trichotomous (3-way) structure. It looks at some problems associated with subjective assessments, particularly fatigue and scanning effects. In addition, it addresses the elusive issue of the minimum sample size necessary to achieve statistical relevance in subjective tests. This leads to the question of the reliability of subjects, a problem which may be resolved with a robust assessment method.
UR - http://www.scopus.com/inward/record.url?scp=34249309559&partnerID=8YFLogxK
UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-34249309559&origin=recordpage
U2 - 10.1109/TENCON.2005.300872
DO - 10.1109/TENCON.2005.300872
M3 - RGC 32 - Refereed conference paper (with host publication)
SN - 0780393112
SN - 9780780393110
VL - 2007
T3 - IEEE Region 10 Annual International Conference, Proceedings/TENCON
BT - TENCON 2005 - 2005 IEEE Region 10 Conference
PB - IEEE
T2 - TENCON 2005 - 2005 IEEE Region 10 Conference
Y2 - 21 November 2005 through 24 November 2005
ER -