Study of temperature distribution in the channels of AlGaN/GaN HEMT devices by μ- Raman characterization techniques
- J. Kováč Jr.
- , S. K. Jha
- , E. V. Jelenković
- , O. Kutsay
- , M. Pejović
- , C. Surya
- , J. A. Zapien
- , I. Bello
- , R. Srnánek
- , J. Kováč
- , S. Flickyngerová
Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review
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