Study of shallow bulk traps in thin nitrided oxide films by thermal re-emission of electrons trapped at high field

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

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Material Science

Earth and Planetary Sciences

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Engineering

Research OutputsResearch Output authored by Study of shallow bulk traps in thin nitrided oxide films by thermal re-emission of electrons trapped at high field is tagged with the concept