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Study of Phase Transition Properties in Epitaxial Ferroelectric Film

  • Chun-Dong Wang
  • , Bao-Hua Teng*
  • , Yong-Feng Ju
  • , Deng-Mu Cheng
  • , Chun-Lai Zhang
  • *Corresponding author for this work

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Abstract

    Based on the transverse Ising model and using decoupling approximation to the Fermi-type Green's function, we study the phase transition properties of the epitaxial ferroelectric film with one substrate. A general recursive equation of the ferroelectric thin film with two n-layer materials is obtained, which enables us to study the phase transition properties for any number layers for epitaxial ferroelectric thin film. With the help of this equation, we analyze the effect of the exchange interaction and the transverse field in the phase diagram, the influence to the polarizations and Curie temperature numerically. The results show that epitaxial ferroelectric film are able to induce a strong increase or decrease of Curie temperature to different exchange interactions and transverse fields within the epitaxial film layers. The theoretical results are in reasonable accordance with experimental data of different ferroelectric thin film.
    Original languageEnglish
    Pages (from-to)756 - 762
    JournalCommunications in Theoretical Physics
    Volume54
    Issue number4
    DOIs
    Publication statusPublished - 2010

    Research Keywords

    • epitaxial ferroelectrics
    • phase transitions

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