Abstract
A novel method using atomic force microscopy (AFM) to study optical fibre structures at the fibre end-face has been successfully developed. The doping concentration profiles of fibres revealed by differential etching speeds in a saturated solution of ammonium bifluoride at room temperature (25°C) were obtained from AFM topographic images. The superior spatial resolution of AFM made it possible to resolve concentric structures a hundred times smaller than the feature, due to the difference in the known refractive index (Δn) of 1 × 10<sup>-3</sup>. Fibres with small core diameters and anisotropic structures, such as polarization-maintaining fibres, were studied with ease. © 1996 Chapman & Hall.
| Original language | English |
|---|---|
| Pages (from-to) | 1563-1570 |
| Journal | Optical and Quantum Electronics |
| Volume | 28 |
| Issue number | 10 |
| DOIs | |
| Publication status | Published - 1996 |
| Externally published | Yes |
Bibliographical note
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