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Study of optical fibre structures by Atomic Force Microscopy

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

Abstract

A novel method using atomic force microscopy (AFM) to study optical fibre structures at the fibre end-face has been successfully developed. The doping concentration profiles of fibres revealed by differential etching speeds in a saturated solution of ammonium bifluoride at room temperature (25°C) were obtained from AFM topographic images. The superior spatial resolution of AFM made it possible to resolve concentric structures a hundred times smaller than the feature, due to the difference in the known refractive index (Δn) of 1 × 10<sup>-3</sup>. Fibres with small core diameters and anisotropic structures, such as polarization-maintaining fibres, were studied with ease. © 1996 Chapman & Hall.
Original languageEnglish
Pages (from-to)1563-1570
JournalOptical and Quantum Electronics
Volume28
Issue number10
DOIs
Publication statusPublished - 1996
Externally publishedYes

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