Study of nanoscale recorded marks on phase-change recording layers and the interactions with surroundings

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

13 Scopus Citations
View graph of relations

Author(s)

Detail(s)

Original languageEnglish
Pages (from-to)861-863
Journal / PublicationIEEE Transactions on Magnetics
Volume43
Issue number2
Publication statusPublished - Feb 2007
Externally publishedYes

Abstract

Conductive-atomic force microscopy (C-AFM) has been used for studying nanoscale recorded marks with different length on the phase-change recording layer of optical disks. Through C-AFM images, a comparison of nanoscale recorded marks on phase-change recording layer under different writing strategies and writing power has been taken. The comparison can help analyze the combination of writing strategy, writing power and laser pulse width. The various lengths of recorded marks for high density data storage have also been found out. The interactions between phase-change recording layers and their surroundings have also been studied. This study opens up a possibility to improve the capacity of data storage in today's commercial optical disks. © 2007 IEEE.

Research Area(s)

  • Conductive-atomic force microscopy (C-AFM), DVD, Optical disk, Phase-change recording layer, Recorded mark, Writing strategy

Bibliographic Note

Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to lbscholars@cityu.edu.hk.

Citation Format(s)

Study of nanoscale recorded marks on phase-change recording layers and the interactions with surroundings. / Lin, Shih Kai; Lin, I. Chun; Chen, Sen Yong et al.

In: IEEE Transactions on Magnetics, Vol. 43, No. 2, 02.2007, p. 861-863.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review