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Study of Image Classification Accuracy with Fourier Ptychography

Hongbo Zhang*, Yaping Zhang*, Lin Wang, Zhijuan Hu, Wenjing Zhou, Peter W. M. Tsang, Deng Cao, Ting-Chung Poon

*Corresponding author for this work

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

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Abstract

In this research, the accuracy of image classification with Fourier Ptychography Microscopy (FPM) has been systematically investigated. Multiple linear regression shows a strong linear relation-ship between the results of image classification accuracy and image visual appearance quality based on PSNR and SSIM with multiple training datasets including MINST, Fashion MNIST, Cifar, Caltech 101, and customized training datasets. It is, therefore, feasible to predict the image classification accuracy only based on PSNR and SSIM. It is also found that the image classification accuracy of FPM reconstructed with higher resolution images is significantly different from using the lower resolution images under the lower numerical aperture (NA) condition. The difference is yet less pronounced under the higher NA condition.
Original languageEnglish
Article number4500
JournalApplied Sciences (Switzerland)
Volume11
Issue number10
Online published14 May 2021
DOIs
Publication statusPublished - May 2021

Research Keywords

  • Deep learning
  • Fourier ptychography
  • Image classification
  • Neural network

Publisher's Copyright Statement

  • This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https:// creativecommons.org/licenses/by/ 4.0/).

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