Abstract
In this research, the accuracy of image classification with Fourier Ptychography Microscopy (FPM) has been systematically investigated. Multiple linear regression shows a strong linear relation-ship between the results of image classification accuracy and image visual appearance quality based on PSNR and SSIM with multiple training datasets including MINST, Fashion MNIST, Cifar, Caltech 101, and customized training datasets. It is, therefore, feasible to predict the image classification accuracy only based on PSNR and SSIM. It is also found that the image classification accuracy of FPM reconstructed with higher resolution images is significantly different from using the lower resolution images under the lower numerical aperture (NA) condition. The difference is yet less pronounced under the higher NA condition.
| Original language | English |
|---|---|
| Article number | 4500 |
| Journal | Applied Sciences (Switzerland) |
| Volume | 11 |
| Issue number | 10 |
| Online published | 14 May 2021 |
| DOIs | |
| Publication status | Published - May 2021 |
Research Keywords
- Deep learning
- Fourier ptychography
- Image classification
- Neural network
Publisher's Copyright Statement
- This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https:// creativecommons.org/licenses/by/ 4.0/).
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Dive into the research topics of 'Study of Image Classification Accuracy with Fourier Ptychography'. Together they form a unique fingerprint.Projects
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GRF: Enhanced Quality Holographic Pprojection System
TSANG, W. M. P. (Principal Investigator / Project Coordinator)
1/09/19 → 1/08/22
Project: Research
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