Abstract
Significant improvements in the dimensionless thermoelectric figure-of-merit (ZT) for nanostructured bismuth telluride, Bi2Te 3, and its alloys have been demonstrated. In designing high-performance thermoelectric devices, variations in the thermal and electrical contact resistances due to interfacial effects between the nanostructured alloy and the metallic electrodes remain a significant issue. Smooth scratch-free surfaces should provide a baseline for contact resistance studies. In this paper, the root mean square roughness over a 10 μm 2 of nanostructured bismuth tellurium based alloys was reduced from 133 nm to 1.9 nm by a procedure consisting of electrolysis, mechanical polishing, and chemical mechanical polishing (CMP). Post-CMP cleaning was also developed to yield a wettable surface for the subsequent conformable metallization. © 2010 Elsevier Ltd. All rights reserved.
| Original language | English |
|---|---|
| Pages (from-to) | 3079-3084 |
| Journal | Electrochimica Acta |
| Volume | 56 |
| Issue number | 8 |
| DOIs | |
| Publication status | Published - 1 Mar 2011 |
| Externally published | Yes |
Bibliographical note
Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].Research Keywords
- Bismuth telluride based alloys
- Chemical mechanical polishing
- Electrolysis
- Nanostructures
- Thermoelectrics