Structure of nanocrystalline GaN from X-ray diffraction, Rietveld and atomic pair distribution function analyses

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

44 Scopus Citations
View graph of relations

Author(s)

  • V. Petkov
  • M. Gateshki
  • J. Choi
  • E. G. Gillan
  • Y. Ren

Detail(s)

Original languageEnglish
Pages (from-to)4654-4659
Journal / PublicationJournal of Materials Chemistry
Volume15
Issue number43
Publication statusPublished - 21 Nov 2005
Externally publishedYes

Abstract

The three-dimensional structure of nanocrystalline GaN has been studied by X-ray diffraction, Rietveld and atomic pair distribution function (PDF) analyses. The material is of very limited structural coherence, yet possess a well-defined atomic arrangement resembling the wurtzite structure. The study demonstrates the great power of X-ray diffraction and the PDF approach in determining the three-dimensional structure of nanocrystalline materials. © The Royal Society of Chemistry 2005.

Bibliographic Note

Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to lbscholars@cityu.edu.hk.

Citation Format(s)

Structure of nanocrystalline GaN from X-ray diffraction, Rietveld and atomic pair distribution function analyses. / Petkov, V.; Gateshki, M.; Choi, J.; Gillan, E. G.; Ren, Y.

In: Journal of Materials Chemistry, Vol. 15, No. 43, 21.11.2005, p. 4654-4659.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review