Structure Identification of Two-Dimensional Colloidal Semiconductor Nanocrystals with Atomic Flat Basal Planes

Dongdong Chen, Yuan Gao, Yiya Chen, Yang Ren, Xiaogang Peng*

*Corresponding author for this work

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

71 Citations (Scopus)

Abstract

Discrete nature of thickness and flat basal planes of two-dimensional (2D) nanostructures display unique diffraction features. Their origin was uncovered by a new analysis method of powder X-ray diffraction, which reveals thickness and lattice orientation of the 2D nanostructures. Results indicate necessity of adoption of a different unit cell from the corresponding bulk crystal with the same internal atomic packing. For CdSe 2D nanostructures with zinc blende atomic packing, pseudotetragonal lattices are adequate, instead of face-centered cubic.
Original languageEnglish
Pages (from-to)4477-4482
JournalNano Letters
Volume15
Issue number7
DOIs
Publication statusPublished - 8 Jul 2015
Externally publishedYes

Bibliographical note

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Research Keywords

  • nanocrystals
  • simulation
  • thickness
  • two-dimensional
  • unit-cell
  • XRD

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