Skip to main navigation Skip to search Skip to main content

Structural and electronic properties of Y1-xGexTe (Y=Sn,Pb) by DFT

  • Shah Khalid
  • , G. Murtaza*
  • , Saeed Ullah Jan
  • , Naeem Ullah
  • , Abdullah Yar
  • *Corresponding author for this work

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Abstract

    The structural, electronic, and chemical bonding properties of the Ge doped PbTe and SnTe in the rock salt phase have been calculated by full potential linearized augmented plane wave method within density functional theory. Generalized gradient approximation of Wu and Cohen has been utilized for calculating these properties. With doping of Ge in Pb1-xGexTe and Sn1-xGexTe, the lattice constant reduces linearly as the concentration increases. Also, it is observed that electronic properties of these compounds are affected by varying concentration of doping Ge. The band gap of corresponding compounds varies with respect to the composition, so the electronic properties alter as doping increases. The alloys have direct band gap which varies in the range 0 to 0.19 eV. The alloys Pb1-xGexTe and Sn1-xSnx Te show covalent bonding nature which enhances by increasing the Ge concentration. As the physical properties vary widely with doping therefore the resulted materials can be used in thermoelectric, optical storage devices, Infrared detectors, Bragg's reflectors and optical devices working in lower frequency regime.
    Original languageEnglish
    Pages (from-to)694-700
    JournalIndian Journal of Pure and Applied Physics
    Volume54
    Issue number11
    Publication statusPublished - Nov 2016

    Research Keywords

    • Density functional theory
    • Electronic properties
    • Structural properties

    Fingerprint

    Dive into the research topics of 'Structural and electronic properties of Y1-xGexTe (Y=Sn,Pb) by DFT'. Together they form a unique fingerprint.

    Cite this