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Structural analysis of arc deposited diamond-like carbon films by Raman and X-ray photoelectron spectroscopy

  • Liuhe Li
  • , Haiquan Zhang
  • , Yanhua Zhang
  • , Paul K. Chu
  • , Xiubo Tian
  • , Lifang Xia
  • , Xinxin Ma

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Abstract

    Diamond-like carbon (DLC) films were deposited using metal arc under different experimental conditions. The ultra microhardness and load-displacement curves show that the typical hardness values of the deposited films range from 10 to 100 GPa. The detailed relationship between the sp3 structure and the D peak observed in the Raman spectra is investigated. For further studies, the C1s binding energy was determined employing X-ray photoelectron spectroscopy. Our results disclose that DLC films with very different sp3 structures may exhibit similar D Raman peaks. © 2002 Elsevier Science B.V. All rights reserved.
    Original languageEnglish
    Pages (from-to)95-101
    JournalMaterials Science and Engineering B: Solid-State Materials for Advanced Technology
    Volume94
    Issue number1
    DOIs
    Publication statusPublished - 15 Jun 2002

    Research Keywords

    • Diamond-like carbon films
    • Hardness
    • Raman spectroscopy
    • X-ray photoelectron spectroscopy

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