Stress intensity factors and T-stress for an edge interface crack by symplectic expansion

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review

16 Scopus Citations
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Author(s)

  • Zhenhuan Zhou
  • Xinsheng Xu
  • Andrew Y.T. Leung
  • Yi Huang

Detail(s)

Original languageEnglish
Pages (from-to)334-337
Journal / PublicationEngineering Fracture Mechanics
Volume102
Publication statusPublished - Apr 2013

Abstract

An analytical method is presented for finding the complex stress intensity factors (SIFs) and T-stress at an edge bi-material interface crack. A Hamiltonian system is first established by introducing dual (conjugate) variables of displacements and stresses whose solutions are expanded in terms of the symplectic series. With the aid of the adjoint symplectic orthogonality, coefficients of the series are determined by the boundary conditions along the crack faces and along the external geometry. Analytical solutions of SIFs and T-stress are obtained simultaneously. Numerical examples including the complex mixed boundary conditions are given. Factors influencing the SIFs are discussed. © 2013 Elsevier Ltd.

Research Area(s)

  • Complex stress intensity factor, Interface crack, Symplectic method, T-stress

Citation Format(s)

Stress intensity factors and T-stress for an edge interface crack by symplectic expansion. / Zhou, Zhenhuan; Xu, Xinsheng; Leung, Andrew Y.T.; Huang, Yi.

In: Engineering Fracture Mechanics, Vol. 102, 04.2013, p. 334-337.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalNot applicablepeer-review