Stress intensity factors and T-stress for an edge interface crack by symplectic expansion

Zhenhuan Zhou*, Xinsheng Xu, Andrew Y.T. Leung, Yi Huang

*Corresponding author for this work

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    23 Citations (Scopus)

    Abstract

    An analytical method is presented for finding the complex stress intensity factors (SIFs) and T-stress at an edge bi-material interface crack. A Hamiltonian system is first established by introducing dual (conjugate) variables of displacements and stresses whose solutions are expanded in terms of the symplectic series. With the aid of the adjoint symplectic orthogonality, coefficients of the series are determined by the boundary conditions along the crack faces and along the external geometry. Analytical solutions of SIFs and T-stress are obtained simultaneously. Numerical examples including the complex mixed boundary conditions are given. Factors influencing the SIFs are discussed. © 2013 Elsevier Ltd.
    Original languageEnglish
    Pages (from-to)334-337
    JournalEngineering Fracture Mechanics
    Volume102
    Online published19 Mar 2013
    DOIs
    Publication statusPublished - Apr 2013

    Research Keywords

    • Complex stress intensity factor
    • Interface crack
    • Symplectic method
    • T-stress

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