Strain effects and thickness dependence of ferroelectric properties in epitaxial BiFeO3 thin films

Hua Ma; Lang Chen; Junling Wang; J. Ma; F. Boey

doi:10.1063/1.2920192

Author(s)

Hua Ma
Lang Chen
Junling Wang
J. Ma
F. Boey

Detail(s)

Original language	English
Article number	182902
Journal / Publication	Applied Physics Letters
Volume	92
Issue number	18
Publication status	Published - 5 May 2008
Externally published	Yes

Link(s)

DOI	DOI https://doi.org/10.1063/1.2920192 Final Published version
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Link to Scopus	https://www.scopus.com/record/display.uri?eid=2-s2.0-43349098297&origin=recordpage
Permanent Link	https://scholars.cityu.edu.hk/en/publications/publication(43fdb5fc-8ca4-42a5-bfef-5e1ec236ffc6).html

Abstract

A "misfit strain-temperature" phase diagram for BiFeO₃ thin film was constructed based on the Landau-Devonshire theory with the mechanical substrate effect. It is found that the polarization instabilities result in the formation of the monoclinic phases in BiFeO₃ thin films. The effective substrate lattice parameter has been introduced to calculate the film thickness dependence of the polarization and the dielectric constants. The theoretical results are in agreement with the experimental data for the thickness dependence of ferroelectric properties of the BiFeO₃ epitaxial thin films on SrTiO₃ and Si substrates. © 2008 American Institute of Physics.

Citation Format(s)

[ RIS ] [ BibTeX ]

Strain effects and thickness dependence of ferroelectric properties in epitaxial BiFeO₃ thin films. / Ma, Hua; Chen, Lang; Wang, Junling et al.
In: Applied Physics Letters, Vol. 92, No. 18, 182902, 05.05.2008.

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

Ma, H, Chen, L, Wang, J, Ma, J & Boey, F 2008, 'Strain effects and thickness dependence of ferroelectric properties in epitaxial BiFeO₃ thin films', Applied Physics Letters, vol. 92, no. 18, 182902. https://doi.org/10.1063/1.2920192

Ma, H., Chen, L., Wang, J., Ma, J., & Boey, F. (2008). Strain effects and thickness dependence of ferroelectric properties in epitaxial BiFeO₃ thin films. Applied Physics Letters, 92(18), Article 182902. https://doi.org/10.1063/1.2920192

Ma H, Chen L, Wang J, Ma J, Boey F. Strain effects and thickness dependence of ferroelectric properties in epitaxial BiFeO₃ thin films. Applied Physics Letters. 2008 May 5;92(18):182902. doi: 10.1063/1.2920192

Ma, Hua ; Chen, Lang ; Wang, Junling et al. / Strain effects and thickness dependence of ferroelectric properties in epitaxial BiFeO₃ thin films. In: Applied Physics Letters. 2008 ; Vol. 92, No. 18.