Stochastic modelling and analysis of degradation for highly reliable products
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Pages (from-to) | 16-32 |
Journal / Publication | Applied Stochastic Models in Business and Industry |
Volume | 31 |
Issue number | 1 |
Online published | 10 Oct 2014 |
Publication status | Published - 2015 |
Link(s)
Abstract
Degradation models have become an important analytic tool for complex systems. During the last two decades, a number of degradation models have been developed to capture the degradation dynamics of a system and aid the subsequent decision-makings. This paper is aimed at providing a summary of the state of the arts in the field, and discussing some further research issues from both analytical and practical point of view. In this paper, degradation models are classified into three classes, that is, stochastic process models, general path models, and other models beyond these two classes. A review on the three classes is given with emphasis on the class of stochastic process models. A comprehensive comparison between stochastic process models and general path models is given to expound the pros and cons of these two methods. Applications of degradation models in degradation test planning and burn-in modelling will also be discussed.
Research Area(s)
- Data-driven methods, Degradation-based burn-in, General path models, Stochastic process models, Wiener processes
Citation Format(s)
Stochastic modelling and analysis of degradation for highly reliable products. / Yea, Zhi-Sheng; Xie, Min.
In: Applied Stochastic Models in Business and Industry, Vol. 31, No. 1, 2015, p. 16-32.
In: Applied Stochastic Models in Business and Industry, Vol. 31, No. 1, 2015, p. 16-32.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review