Stochastic modelling and analysis of degradation for highly reliable products

Zhi-Sheng Yea, Min Xie*

*Corresponding author for this work

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    208 Citations (Scopus)

    Abstract

    Degradation models have become an important analytic tool for complex systems. During the last two decades, a number of degradation models have been developed to capture the degradation dynamics of a system and aid the subsequent decision-makings. This paper is aimed at providing a summary of the state of the arts in the field, and discussing some further research issues from both analytical and practical point of view. In this paper, degradation models are classified into three classes, that is, stochastic process models, general path models, and other models beyond these two classes. A review on the three classes is given with emphasis on the class of stochastic process models. A comprehensive comparison between stochastic process models and general path models is given to expound the pros and cons of these two methods. Applications of degradation models in degradation test planning and burn-in modelling will also be discussed.
    Original languageEnglish
    Pages (from-to)16-32
    JournalApplied Stochastic Models in Business and Industry
    Volume31
    Issue number1
    Online published10 Oct 2014
    DOIs
    Publication statusPublished - 2015

    Research Keywords

    • Data-driven methods
    • Degradation-based burn-in
    • General path models
    • Stochastic process models
    • Wiener processes

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