Steady-State Cascading Failure Model With Voltage Instability Event Detection
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
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Detail(s)
Original language | English |
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Pages (from-to) | 463-472 |
Journal / Publication | IEEE Transactions on Circuits and Systems I: Regular Papers |
Volume | 71 |
Issue number | 1 |
Online published | 24 Oct 2023 |
Publication status | Published - Jan 2024 |
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Abstract
This study proposes a cascading failure model for power systems that addresses event-triggered power flow divergence. After a cascading failure event, voltage instability is a major cause of event-triggered power flow divergence. To detect voltage instability events, we track the steady-state voltage profiles across successive cascade generations by adopting continuation power flow (CPF). Various cascading failure events are incorporated into the CPF computation. Hence, the proposed model can identify voltage instability by monitoring the emergence of buses that hit a saddle-node bifurcation (SNB) point. In this way, the proposed cascading failure model is able to derive equilibrium points, if they exist, under all conditions. Furthermore, the model incorporates primary frequency control instead of slack buses to account for power losses, thereby improving the accuracy of the results. In addition, we propose a set of metrics to measure the cascading failure propagation rate and the influence of voltage instability events on cascading failure outcomes. Experimental results indicate that power system configurations exert a significant influence on voltage instability events. © 2023 IEEE
Research Area(s)
- Cascading failure, continuation power flow, equilibrium tracking, Integrated circuit modeling, Load flow, Load modeling, Power system faults, Power system protection, Power system stability, power system vulnerability, Steady-state, voltage collapse
Citation Format(s)
Steady-State Cascading Failure Model With Voltage Instability Event Detection. / Li, Meixuan Jade; Tse, Chi K.; Yi, Ming.
In: IEEE Transactions on Circuits and Systems I: Regular Papers, Vol. 71, No. 1, 01.2024, p. 463-472.
In: IEEE Transactions on Circuits and Systems I: Regular Papers, Vol. 71, No. 1, 01.2024, p. 463-472.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review