Statistical analysis of exponential lifetimes under an integrated type-II interval censoring scheme
Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Author(s)
Related Research Unit(s)
Detail(s)
| Original language | English |
|---|---|
| Pages (from-to) | 461-471 |
| Journal / Publication | Journal of Statistical Computation and Simulation |
| Volume | 72 |
| Issue number | 6 |
| Publication status | Published - 2002 |
Link(s)
Abstract
In this paper, we propose a new type of censoring scheme which combines the features of grouped censoring and Type-II censoring. Statistical analysis of exponentially distributed lifetimes observed under this scheme is considered. The MLE of the model parameter and its asymptotic variance are derived. Furthermore, expressions for the expected experiment time and the expected number of failures are given. A numerical study is conducted to study these quantities and the results are compared with those under a Type-II censored plan. This comparison provides useful insight on the choice of these plans in designing a life test.
Research Area(s)
- Asymptotic variance, Expected experiment times, Exponential distributed lifetime, MLE, Type-II interval censoring
Citation Format(s)
Statistical analysis of exponential lifetimes under an integrated type-II interval censoring scheme. / Tse, Siu-Keung; Yuen, Hak-Keung; Yang, Chunyan.
In: Journal of Statistical Computation and Simulation, Vol. 72, No. 6, 2002, p. 461-471.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
