Stable Switching of Resistive Random Access Memory on the Nanotip Array Electrodes

Kun-Tong Tsai, Chih-Hsiang Ho, Wen-Yuan Chang, Jr-Jian Ke, Elif Selin Mungan, Yuh-Lin Wang, Jr-Hau He*

*Corresponding author for this work

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

Abstract

The formation/rupture of conducting filaments (CFs) in resistive random access memory (ReRAM) materials tune the electrical conductivities non-volatilely and are largely affected by its material composition [1], internal configurations [2] and external environments [3,4]. Therefore, controlling repetitive formation/rupture of CF as well as the spatial uniformity of formed CF are fundamentally important for improving the resistive switching (RS) performance. In this context, we have shown that by adding a field initiator, typically a textured electrode, both performance and switching uniformity of ReRAMs can be improved dramatically [5]. In addition, despite its promising characteristics, the scalable fabrication and structural homogeneity of such nanostructured electrodes are still lacking or unattainable, making miniaturization of ReRAM devices an exceeding challenge. Here, we employ nanostructured electrode (nanotip arrays, extremely uniform) formed spontaneously via a self-organized process to improve the ZnO ReRAM switching characteristics.
Original languageEnglish
Title of host publication74th Annual Device Research Conference (DRC)
PublisherIEEE
ISBN (Electronic)978-1-5090-2828-3
ISBN (Print)978-1-5090-2827-6, 978-1-5090-2829-0
DOIs
Publication statusPublished - Jun 2016
Externally publishedYes
Event74th Annual Device Research Conference (DRC) - Newark, United States
Duration: 19 Jun 201622 Jun 2016

Publication series

NameDevice Research Conference
PublisherIEEE
ISSN (Print)1548-3770

Conference

Conference74th Annual Device Research Conference (DRC)
PlaceUnited States
CityNewark
Period19/06/1622/06/16

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