Sputter deposition of cathodes in organic light emitting diodes
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Pages (from-to) | 4607-4612 |
Journal / Publication | Journal of Applied Physics |
Volume | 86 |
Issue number | 8 |
Publication status | Published - 15 Oct 1999 |
Link(s)
Abstract
Sputter deposition was employed for cathode preparation in organic light emitting diodes (OLEDs). A thin film of copper phthalocyanine (CuPc) was found to be an effective buffer layer in preventing sputter damage to the OLED layer structure. However, the CuPc layer forms an electron-injection barrier with the underlying Alq layer, resulting in increased electron-hole recombination in the nonemissive CuPc layer, and thus a substantial reduction in electroluminescence efficiency. Incorporation of Li at the CuPc/Alq interface from a sputter-deposited Al (Li) cathode was found to reduce the injection barrier at the interface and make the overall device efficiency comparable to a device having an evaporated MgAg cathode. The devices exhibited good operational stability with a half lifetime greater than 3800 h at 20 mA/cm2. © 1999 American Institute of Physics.
Research Area(s)
Citation Format(s)
Sputter deposition of cathodes in organic light emitting diodes. / Hung, L. S.; Liao, L. S.; Lee, C. S. et al.
In: Journal of Applied Physics, Vol. 86, No. 8, 15.10.1999, p. 4607-4612.
In: Journal of Applied Physics, Vol. 86, No. 8, 15.10.1999, p. 4607-4612.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review