Special section reliability and variability of devices for circuits and systems

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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Author(s)

  • Asen Asenov
  • Ulf Schlichtmann
  • Cher Ming Tan
  • Hei Wong
  • Xing Zhou

Related Research Unit(s)

Detail(s)

Original languageEnglish
Journal / PublicationMicroelectronics Reliability
Volume54
Issue number6-7
Publication statusPublished - Jun 2014

Citation Format(s)

Special section reliability and variability of devices for circuits and systems. / Asenov, Asen; Schlichtmann, Ulf; Tan, Cher Ming; Wong, Hei; Zhou, Xing.

In: Microelectronics Reliability, Vol. 54, No. 6-7, 06.2014.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review