Special Issue on Reliability

Research output: Journal Publications and Reviews › Editorial Preface

Author(s)

Original language	English
Pages (from-to)	4497-4503
Journal / Publication	IEEE Transactions on Electron Devices
Volume	66
Issue number	11
Online published	29 Oct 2019
Publication status	Published - Nov 2019

DOI	DOI https://doi.org/10.1109/TED.2019.2943987 Final Published version
	Check@CityULib
Link to Scopus	https://www.scopus.com/record/display.uri?eid=2-s2.0-85074514886&origin=recordpage
Permanent Link	https://scholars.cityu.edu.hk/en/publications/publication(205ed566-11cc-49ed-9647-539e0c0c6a1f).html

[ RIS ] [ BibTeX ]

Special Issue on Reliability. / MAHAPATRA, Souvik; KERBER, Andreas; COMPAGNONI, Christian Monzio et al.
In: IEEE Transactions on Electron Devices, Vol. 66, No. 11, 11.2019, p. 4497-4503.

Research output: Journal Publications and Reviews › Editorial Preface

MAHAPATRA, S, KERBER, A, COMPAGNONI, CM, KOVAL, R, MENEGHESSO, G, SHERIDAN, D, RAMEY, S, WANG, R, STATHIS, J, CHEN, KJ, KACZER, B, PANCHERI, L, ROSENBAUM, E, MOULI, C & WONG, H 2019, 'Special Issue on Reliability', IEEE Transactions on Electron Devices, vol. 66, no. 11, pp. 4497-4503. https://doi.org/10.1109/TED.2019.2943987

MAHAPATRA, S., KERBER, A., COMPAGNONI, C. M., KOVAL, R., MENEGHESSO, G., SHERIDAN, D., RAMEY, S., WANG, R., STATHIS, J., CHEN, K. J., KACZER, B., PANCHERI, L., ROSENBAUM, E., MOULI, C., & WONG, H. (2019). Special Issue on Reliability. IEEE Transactions on Electron Devices, 66(11), 4497-4503. https://doi.org/10.1109/TED.2019.2943987

MAHAPATRA S, KERBER A, COMPAGNONI CM, KOVAL R, MENEGHESSO G, SHERIDAN D et al. Special Issue on Reliability. IEEE Transactions on Electron Devices. 2019 Nov;66(11):4497-4503. Epub 2019 Oct 29. doi: 10.1109/TED.2019.2943987

MAHAPATRA, Souvik ; KERBER, Andreas ; COMPAGNONI, Christian Monzio et al. / Special Issue on Reliability. In: IEEE Transactions on Electron Devices. 2019 ; Vol. 66, No. 11. pp. 4497-4503.