Special Issue on Reliability

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)Editorial Preface

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Author(s)

  • Souvik MAHAPATRA
  • Andreas KERBER
  • Christian Monzio COMPAGNONI
  • Randy KOVAL
  • Gaudenzio MENEGHESSO
  • David SHERIDAN
  • Stephen RAMEY
  • Runsheng WANG
  • Jim STATHIS
  • Kevin J. CHEN
  • Ben KACZER
  • Lucio PANCHERI
  • Elyse ROSENBAUM
  • Chandra MOULI

Related Research Unit(s)

Detail(s)

Original languageEnglish
Pages (from-to)4497-4503
Journal / PublicationIEEE Transactions on Electron Devices
Volume66
Issue number11
Online published29 Oct 2019
Publication statusPublished - Nov 2019

Citation Format(s)

Special Issue on Reliability. / MAHAPATRA, Souvik; KERBER, Andreas; COMPAGNONI, Christian Monzio; KOVAL, Randy; MENEGHESSO, Gaudenzio; SHERIDAN, David; RAMEY, Stephen; WANG, Runsheng; STATHIS, Jim; CHEN, Kevin J.; KACZER, Ben; PANCHERI, Lucio; ROSENBAUM, Elyse; MOULI, Chandra; WONG, Hei.

In: IEEE Transactions on Electron Devices, Vol. 66, No. 11, 11.2019, p. 4497-4503.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)Editorial Preface