Spatial-Construction-Based Abnormality Detection and Localization for Distributed Parameter Systems
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Pages (from-to) | 4707-4714 |
Journal / Publication | IEEE Transactions on Industrial Informatics |
Volume | 18 |
Issue number | 7 |
Online published | 20 Oct 2021 |
Publication status | Published - Jul 2022 |
Link(s)
Abstract
A spatial-construction-based fault diagnosis method is proposed to detect and locate the abnormality for unknown distributed parameter systems (DPSs). To accurately locate the abnormality, the continuous spatial basis functions (SBFs) are derived by the proposed spatial construction method from empirical data. Theoretical analysis proves that the B-spline curve is a proper solution to the spatial construction problem. Two new statistics are constructed based on the derived continuous SBFs and the improved independent component analysis algorithm. The abnormality can be timely detected according to the reference signals derived by the central limit theorem and hypothesis testing. With the continuous SBFs, the probability distribution of statistic contribution can be constructed to reveal the actual position of the abnormality. The proposed method can timely detect and locate the abnormality under fewer sensors without the knowledge of PDE and boundary conditions. The internal short circuit experiment on a lithium-ion battery demonstrates the effectiveness and superiority of the proposed method.
Research Area(s)
- Distributed parameter system (DPS), fault diagnosis, lithium-ion battery, spatial construction
Bibliographic Note
Research Unit(s) information for this publication is provided by the author(s) concerned.
Citation Format(s)
Spatial-Construction-Based Abnormality Detection and Localization for Distributed Parameter Systems. / Wei, Peng; Li, Han-Xiong; Xie, Shengli.
In: IEEE Transactions on Industrial Informatics, Vol. 18, No. 7, 07.2022, p. 4707-4714.
In: IEEE Transactions on Industrial Informatics, Vol. 18, No. 7, 07.2022, p. 4707-4714.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review