Abstract
Making quantified statements about the uncertainty associated with the lifelength of an item is one of the most fundamental tasks of reliability assessment. Most practitioners routinely do this using one of the several available statistical techniques. The purpose of this paper is two-fold. The first is to give the user an overview of the key tenets of two of the most commonly used parametric approaches. The second is to point out that these commonly used approaches involve strategies that are either ad hoc, or are in violation of some of the underlying tenets. A method that is devoid of logical flaws can be proposed, but this method is difficult to implement. The user must therefore resign to using that technique against which the fewest objections can be hurled.
| Original language | English |
|---|---|
| Pages (from-to) | 53-65 |
| Journal | International Statistical Review |
| Volume | 70 |
| Issue number | 1 |
| Publication status | Published - Apr 2002 |
| Externally published | Yes |
Research Keywords
- Bayes Law
- Likelihood Principle
- Maximum Likelihood
- Parameters
- Probability Models
- Relative Frequency
- Subjective Probability