TY - GEN
T1 - Some Bayesian Approaches for Estimating the Failure Rate
AU - Mazzuchi, Thomas A.
AU - Singpurwalla, Nozer D.
PY - 1983
Y1 - 1983
N2 - In this paper we discuss several Bayesian approaches for estimating the failure rate function when no a priori assumption is made about the parametric family of the underlying life distribution. Our results are based on an extension of the existing Bayesian estimates of the cumulative distribution function, which have recently appeared in the literature. In the sequel, we introduce and review the Dirichlet process, the gamma process, and Processes Neutral to the Right, and point out their relevance and usefulness for the problem at hand. © Springer-Verlag Berlin Heidelberg 1983
AB - In this paper we discuss several Bayesian approaches for estimating the failure rate function when no a priori assumption is made about the parametric family of the underlying life distribution. Our results are based on an extension of the existing Bayesian estimates of the cumulative distribution function, which have recently appeared in the literature. In the sequel, we introduce and review the Dirichlet process, the gamma process, and Processes Neutral to the Right, and point out their relevance and usefulness for the problem at hand. © Springer-Verlag Berlin Heidelberg 1983
UR - https://www.scopus.com/pages/publications/0020860015
UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-0020860015&origin=recordpage
U2 - 10.1007/978-3-642-82014-4_4
DO - 10.1007/978-3-642-82014-4_4
M3 - RGC 32 - Refereed conference paper (with host publication)
SN - 978-3-642-82016-8
SN - 9783540122876
T3 - NATO ASI Subseries F: Computer and Systems Sciences
SP - 75
EP - 92
BT - Electronic Systems Effectiveness and Life Cycle Costing
A2 - Skwirzynski, J. K.
PB - Springer
CY - Berlin, Heidelberg
T2 - 1982 NATO Advanced Study Institute on Electronic Systems Effectiveness and Life Cycle Costing
Y2 - 19 July 1982 through 31 July 1982
ER -