Small-signal and large-signal performance test of high-speed optoelectronics devices

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)22_Publication in policy or professional journal

2 Scopus Citations
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Detail(s)

Original languageEnglish
Article number59
Pages (from-to)308-319
Journal / PublicationProceedings of SPIE - The International Society for Optical Engineering
Volume5624
Publication statusPublished - 2005

Conference

TitleSemiconductor and Organic Optoelectronic Materials and Devices
PlaceChina
CityBeijing
Period9 - 11 November 2004

Abstract

This paper presents measurement methods for determining the reflection coefficients and frequency responses of semiconductor laser diodes, photodiodes, and EA modulator chips. A novel method for determining the intrinsic frequency responses of laser diodes is also proposed, and applications of the developed measurement methods are discussed. We demonstrate the compensation of bonding wire on the capacitances of both the submount and the laser diode, and present a method for estimating the potential modulation bandwidth of TO packaging technique. Initial study on removing the effects of test fixture on large-signal performances of optoelectronic devices at high data rate is also given.

Research Area(s)

  • Intrinsic response, Laser diode, Measurement, Parasitic network, Scattering parameters, Test fixture

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