Abstract
This paper presents measurement methods for determining the reflection coefficients and frequency responses of semiconductor laser diodes, photodiodes, and EA modulator chips. A novel method for determining the intrinsic frequency responses of laser diodes is also proposed, and applications of the developed measurement methods are discussed. We demonstrate the compensation of bonding wire on the capacitances of both the submount and the laser diode, and present a method for estimating the potential modulation bandwidth of TO packaging technique. Initial study on removing the effects of test fixture on large-signal performances of optoelectronic devices at high data rate is also given.
| Original language | English |
|---|---|
| Pages (from-to) | 308-319 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 5624 |
| Online published | 31 Jan 2005 |
| DOIs | |
| Publication status | Published - 2005 |
| Event | Asia-Pacific Optical Communications: Semiconductor and Organic Optoelectronic Materials and Devices - Beijing, China Duration: 7 Nov 2004 → 11 Nov 2004 |
Research Keywords
- Intrinsic response
- Laser diode
- Measurement
- Parasitic network
- Scattering parameters
- Test fixture
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