Small Fault Detection for a Class of Closed-Loop Systems via Deterministic Learning

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

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Author(s)

Detail(s)

Original languageEnglish
Article number8303217
Pages (from-to)897-906
Journal / PublicationIEEE Transactions on Cybernetics
Volume49
Issue number3
Publication statusPublished - 1 Mar 2019
Externally publishedYes

Abstract

In this paper, based on the deterministic learning (DL) theory, an approach for detection for small faults in a class of nonlinear closed-loop systems is proposed. First, the DL-based neural control approach and identification approach are employed to extract the knowledge of the control effort that compensates the fault dynamics (change of the control effort) and the fault dynamics (the change of system dynamics due to fault). Second, two types of residuals are constructed. One is to measure the change of system dynamics, another one is to measure change of the control effort. By combining these residuals, an enhanced residual is generated, in which the fault dynamics and the control effort are combined to diagnose the fault. It is shown that the major fault information is compensated by the control, and the major fault information is double in the enhanced residual. Therefore, the fault information in the diagnosis residual is enhanced. Finally, an analysis of the fault detectability condition of the diagnosis scheme is given. Simulation studies are included to demonstrate the effectiveness of the approach. © 2013 IEEE.

Research Area(s)

  • Closed-loop systems, deterministic learning (DL), fault detection, neural networks (NNs)

Bibliographic Note

Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

Citation Format(s)

Small Fault Detection for a Class of Closed-Loop Systems via Deterministic Learning. / Chen, Tianrui; Wang, Cong; Chen, Guo et al.
In: IEEE Transactions on Cybernetics, Vol. 49, No. 3, 8303217, 01.03.2019, p. 897-906.

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review