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SketchDesc: Learning Local Sketch Descriptors for Multi-View Correspondence

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

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Abstract

In this article, we study the problem of multi-view sketch correspondence, where we take as input multiple freehand sketches with different views of the same object and predict as output the semantic correspondence among the sketches. This problem is challenging since the visual features of corresponding points at different views can be very different. To this end, we take a deep learning approach and learn a novel local sketch descriptor from data. We contribute a training dataset by generating the pixel-level correspondence for the multi-view line drawings synthesized from 3D shapes. To handle the sparsity and ambiguity of sketches, we design a novel multi-branch neural network that integrates a patch-based representation and a multi-scale strategy to learn the pixel-level correspondence among multi-view sketches. We demonstrate the effectiveness of our proposed approach with extensive experiments on hand-drawn sketches and multi-view line drawings rendered from multiple 3D shape datasets. © 2021 IEEE.
Original languageEnglish
Article number9163150
Pages (from-to)1738-1750
JournalIEEE Transactions on Circuits and Systems for Video Technology
Volume31
Issue number5
Online published10 Aug 2020
DOIs
Publication statusPublished - May 2021

Research Keywords

  • correspondence learning
  • multi-scale
  • Multi-view sketches
  • patch-based descriptor

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  • COPYRIGHT TERMS OF DEPOSITED POSTPRINT FILE: © 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

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