Single cell adhesion force measurement for viability identification using nanorobotic manipulation system inside ESEM

Yajing Shen; Masahiro Nakajima; Seiji Kojima; Michio Homma; Toshio Fukuda

doi:10.1109/NEMS.2011.6017510

Single cell adhesion force measurement for viability identification using nanorobotic manipulation system inside ESEM

Yajing Shen^*
, Masahiro Nakajima
, Seiji Kojima
, Michio Homma
, Toshio Fukuda

^*Corresponding author for this work

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

9 Citations (Scopus)

Abstract

Cell viability identification is the first step for single cell analysis. In this paper, a novel cell viability identification method was proposed based on the cell adhesion force measurement. Living and dead yeast cell samples were prepared using the stain method. The micro puller for adhesion force measurement was fabricated from atomic force microscopy (AFM) cantilever by focused ion beam (FIB) etching. The spring constant of the micro puller was calibrated by nano manipulation approach. Cell adhesion force measurement was performed by using the nano robotic manipulation system inside an environmental scanning electron microscopy (ESEM). This system can provide the sample observation and manipulation at nano scale. The adhesion force was calculated according to the deformation of the micro puller. The results showed that the adhesion force of living cells is much larger than that of dead cells. Therefore, cell adhesion force is capable for the cell viability identification task at single cell level. © 2011 IEEE.

Original language	English
Title of host publication	NEMS 2011 - 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems
Pages	944-947
DOIs	https://doi.org/10.1109/NEMS.2011.6017510
Publication status	Published - 2011
Externally published	Yes
Event	6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2011 - Kaohsiung, Taiwan, China Duration: 20 Feb 2011 → 23 Feb 2011

Conference

Conference	6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2011
Place	Taiwan, China
City	Kaohsiung
Period	20/02/11 → 23/02/11

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@inproceedings{43cd687639454b5e861357c657461dc6,

title = "Single cell adhesion force measurement for viability identification using nanorobotic manipulation system inside ESEM",

abstract = "Cell viability identification is the first step for single cell analysis. In this paper, a novel cell viability identification method was proposed based on the cell adhesion force measurement. Living and dead yeast cell samples were prepared using the stain method. The micro puller for adhesion force measurement was fabricated from atomic force microscopy (AFM) cantilever by focused ion beam (FIB) etching. The spring constant of the micro puller was calibrated by nano manipulation approach. Cell adhesion force measurement was performed by using the nano robotic manipulation system inside an environmental scanning electron microscopy (ESEM). This system can provide the sample observation and manipulation at nano scale. The adhesion force was calculated according to the deformation of the micro puller. The results showed that the adhesion force of living cells is much larger than that of dead cells. Therefore, cell adhesion force is capable for the cell viability identification task at single cell level. {\textcopyright} 2011 IEEE.",

author = "Yajing Shen and Masahiro Nakajima and Seiji Kojima and Michio Homma and Toshio Fukuda",

year = "2011",

doi = "10.1109/NEMS.2011.6017510",

language = "English",

isbn = "9781612847757",

pages = "944--947",

booktitle = "NEMS 2011 - 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems",

note = "6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2011 ; Conference date: 20-02-2011 Through 23-02-2011",

}

Shen, Y, Nakajima, M, Kojima, S, Homma, M & Fukuda, T 2011, Single cell adhesion force measurement for viability identification using nanorobotic manipulation system inside ESEM. in NEMS 2011 - 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems., 6017510, pp. 944-947, 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2011, Kaohsiung, Taiwan, China, 20/02/11. https://doi.org/10.1109/NEMS.2011.6017510

Single cell adhesion force measurement for viability identification using nanorobotic manipulation system inside ESEM. / Shen, Yajing; Nakajima, Masahiro; Kojima, Seiji et al.
NEMS 2011 - 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems. 2011. p. 944-947 6017510.

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

TY - GEN

T1 - Single cell adhesion force measurement for viability identification using nanorobotic manipulation system inside ESEM

AU - Shen, Yajing

AU - Nakajima, Masahiro

AU - Kojima, Seiji

AU - Homma, Michio

AU - Fukuda, Toshio

PY - 2011

Y1 - 2011

N2 - Cell viability identification is the first step for single cell analysis. In this paper, a novel cell viability identification method was proposed based on the cell adhesion force measurement. Living and dead yeast cell samples were prepared using the stain method. The micro puller for adhesion force measurement was fabricated from atomic force microscopy (AFM) cantilever by focused ion beam (FIB) etching. The spring constant of the micro puller was calibrated by nano manipulation approach. Cell adhesion force measurement was performed by using the nano robotic manipulation system inside an environmental scanning electron microscopy (ESEM). This system can provide the sample observation and manipulation at nano scale. The adhesion force was calculated according to the deformation of the micro puller. The results showed that the adhesion force of living cells is much larger than that of dead cells. Therefore, cell adhesion force is capable for the cell viability identification task at single cell level. © 2011 IEEE.

AB - Cell viability identification is the first step for single cell analysis. In this paper, a novel cell viability identification method was proposed based on the cell adhesion force measurement. Living and dead yeast cell samples were prepared using the stain method. The micro puller for adhesion force measurement was fabricated from atomic force microscopy (AFM) cantilever by focused ion beam (FIB) etching. The spring constant of the micro puller was calibrated by nano manipulation approach. Cell adhesion force measurement was performed by using the nano robotic manipulation system inside an environmental scanning electron microscopy (ESEM). This system can provide the sample observation and manipulation at nano scale. The adhesion force was calculated according to the deformation of the micro puller. The results showed that the adhesion force of living cells is much larger than that of dead cells. Therefore, cell adhesion force is capable for the cell viability identification task at single cell level. © 2011 IEEE.

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U2 - 10.1109/NEMS.2011.6017510

DO - 10.1109/NEMS.2011.6017510

M3 - RGC 32 - Refereed conference paper (with host publication)

SN - 9781612847757

SP - 944

EP - 947

BT - NEMS 2011 - 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems

T2 - 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2011

Y2 - 20 February 2011 through 23 February 2011

ER -

Single cell adhesion force measurement for viability identification using nanorobotic manipulation system inside ESEM

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