Single cell adhesion force measurement for cell viability identification using an AFM cantilever-based micro putter

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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Author(s)

  • Masahiro Nakajima
  • Seiji Kojima
  • Michio Homma
  • Masaru Kojima
  • Toshio Fukuda

Detail(s)

Original languageEnglish
Article number115802
Journal / PublicationMeasurement Science and Technology
Volume22
Issue number11
Publication statusPublished - Nov 2011
Externally publishedYes

Abstract

Fast and sensitive cell viability identification is a key point for single cell analysis. To address this issue, this paper reports a novel single cell viability identification method based on the measurement of single cell shear adhesion force using an atomic force microscopy (AFM) cantilever-based micro putter. Viable and nonviable yeast cells are prepared and put onto three kinds of substrate surfaces, i.e. tungsten probe, gold and ITO substrate surfaces. A micro putter is fabricated from the AFM cantilever by focused ion beam etching technique. The spring constant of the micro putter is calibrated using the nanomanipulation approach. The shear adhesion force between the single viable or nonviable cell and each substrate is measured using the micro putter based on the nanorobotic manipulation system inside an environmental scanning electron microscope. The adhesion force is calculated based on the deflection of the micro putter beam. The results show that the adhesion force of the viable cell to the substrate is much larger than that of the nonviable cell. This identification method is label free, fast, sensitive and can give quantitative results at the single cell level. © 2011 IOP Publishing Ltd.

Citation Format(s)

Single cell adhesion force measurement for cell viability identification using an AFM cantilever-based micro putter. / Shen, Yajing; Nakajima, Masahiro; Kojima, Seiji et al.
In: Measurement Science and Technology, Vol. 22, No. 11, 115802, 11.2011.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review