SIMS / XPS studies of the passive film on nickel

S. C. Tjong

doi:10.1016/0025-5408(82)90165-9

SIMS / XPS studies of the passive film on nickel

S. C. Tjong^*

^*Corresponding author for this work

Department of Physics

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

10 Citations (Scopus)

Abstract

Passive films were formed on nickel in borate buffer solution (pH 8.4) at various anodic potentials. XPS and SIMS techniques were used to determine the passivating species present on the surface film. It is shown that the film formed at low passivating potentials consists of Ni (OH)₂ and NiO, and the film formed preceding oxygen evolution consists mainly of Ni₂O₃.

Original language	English
Pages (from-to)	1297-1304
Number of pages	8
Journal	Materials Research Bulletin
Volume	17
Issue number	10
DOIs	https://doi.org/10.1016/0025-5408(82)90165-9
Publication status	Published - 1982

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title = "SIMS / XPS studies of the passive film on nickel",

abstract = "Passive films were formed on nickel in borate buffer solution (pH 8.4) at various anodic potentials. XPS and SIMS techniques were used to determine the passivating species present on the surface film. It is shown that the film formed at low passivating potentials consists of Ni (OH)2 and NiO, and the film formed preceding oxygen evolution consists mainly of Ni2O3.",

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T1 - SIMS / XPS studies of the passive film on nickel

AU - Tjong, S. C.

PY - 1982

Y1 - 1982

N2 - Passive films were formed on nickel in borate buffer solution (pH 8.4) at various anodic potentials. XPS and SIMS techniques were used to determine the passivating species present on the surface film. It is shown that the film formed at low passivating potentials consists of Ni (OH)2 and NiO, and the film formed preceding oxygen evolution consists mainly of Ni2O3.

AB - Passive films were formed on nickel in borate buffer solution (pH 8.4) at various anodic potentials. XPS and SIMS techniques were used to determine the passivating species present on the surface film. It is shown that the film formed at low passivating potentials consists of Ni (OH)2 and NiO, and the film formed preceding oxygen evolution consists mainly of Ni2O3.

UR - https://www.scopus.com/pages/publications/0020195081

UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-0020195081&origin=recordpage

U2 - 10.1016/0025-5408(82)90165-9

DO - 10.1016/0025-5408(82)90165-9

M3 - RGC 21 - Publication in refereed journal

AN - SCOPUS:0020195081

SN - 0025-5408

VL - 17

SP - 1297

EP - 1304

JO - Materials Research Bulletin

JF - Materials Research Bulletin

IS - 10

ER -

SIMS / XPS studies of the passive film on nickel

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