SIMS QUANTITATIVE TRACE ELEMENT ANALYSIS OF MICRODROPLETS

Robert W. Odom; Gayle Lux; Ronald H. Fleming; Paul K. Chu; Richard J. Blattner

SIMS QUANTITATIVE TRACE ELEMENT ANALYSIS OF MICRODROPLETS

Robert W. Odom
, Gayle Lux
, Ronald H. Fleming
, Paul K. Chu
, Richard J. Blattner

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

Original language	English
Title of host publication	Proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry (SIMS VI)
Editors	A Benninghoven, A M Huber, H W Werner
Publisher	John Wiley & Sons
Pages	885-887
Publication status	Published - Sept 1987
Externally published	Yes
Event	Sixth International Conference on Secondary Ion Mass Spectrometry - Palais des Congres, Versailles, Paris, France Duration: 13 Sept 1987 → 18 Sept 1987

Conference

Conference	Sixth International Conference on Secondary Ion Mass Spectrometry
Abbreviated title	SIMS VI
Place	France
City	Paris
Period	13/09/87 → 18/09/87

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@inproceedings{4232e420f09c4d3a8c10c1e05cff8ef0,

title = "SIMS QUANTITATIVE TRACE ELEMENT ANALYSIS OF MICRODROPLETS",

author = "Odom, \{Robert W.\} and Gayle Lux and Fleming, \{Ronald H.\} and Chu, \{Paul K.\} and Blattner, \{Richard J.\}",

year = "1987",

month = sep,

language = "English",

pages = "885--887",

editor = "A Benninghoven and Huber, \{A M \} and Werner, \{H W\}",

booktitle = "Proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry (SIMS VI)",

publisher = "John Wiley \& Sons",

address = "United States",

note = "Sixth International Conference on Secondary Ion Mass Spectrometry, SIMS VI ; Conference date: 13-09-1987 Through 18-09-1987",

}

Odom, RW, Lux, G, Fleming, RH, Chu, PK & Blattner, RJ 1987, SIMS QUANTITATIVE TRACE ELEMENT ANALYSIS OF MICRODROPLETS. in A Benninghoven, AM Huber & HW Werner (eds), Proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry (SIMS VI). John Wiley & Sons, pp. 885-887, Sixth International Conference on Secondary Ion Mass Spectrometry, Paris, France, 13/09/87.

SIMS QUANTITATIVE TRACE ELEMENT ANALYSIS OF MICRODROPLETS. / Odom, Robert W.; Lux, Gayle; Fleming, Ronald H. et al.
Proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry (SIMS VI). ed. / A Benninghoven; A M Huber; H W Werner. John Wiley & Sons, 1987. p. 885-887.

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

TY - GEN

T1 - SIMS QUANTITATIVE TRACE ELEMENT ANALYSIS OF MICRODROPLETS

AU - Odom, Robert W.

AU - Lux, Gayle

AU - Fleming, Ronald H.

AU - Chu, Paul K.

AU - Blattner, Richard J.

PY - 1987/9

Y1 - 1987/9

M3 - RGC 32 - Refereed conference paper (with host publication)

SP - 885

EP - 887

BT - Proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry (SIMS VI)

A2 - Benninghoven, A

A2 - Huber, A M

A2 - Werner, H W

PB - John Wiley & Sons

T2 - Sixth International Conference on Secondary Ion Mass Spectrometry

Y2 - 13 September 1987 through 18 September 1987

ER -